SCHEDULED SHORT COURSES:

 

 

NOTE: on-site short courses or training on XPS/ESCA, AES, and CasaXPS can be scheduled at your facility at any time. Contact me for details.

 

Please email me to be placed on a mailing list for short courses, specifying your interest: AES, XPS/ESCA, CasaXPS.

 

Due to travel restrictions and the Covid-19 pandemic, I am giving live online short courses:

I have had interest from colleagues in Asia, Europe and the USA, so timing will be challenging. I plan on offering the courses from 09:00 am until 05:00 pm Eastern Daylight Savings Time in the USA so participants in the western states of the USA, Eastern states of the USA, and in Europe could participate. The timing would be more difficult for participants from Asia. I would have a 10 min break every hour and an hour break at lunchtime.

2-day AES online short course, 12-13 April 2021. Email me if you are interested. Registration will open in January.

3-day XPS, 2-day hands-on CasaXPS (5 days in a row) in May or June 2021.

The cost for the AES course will be $1,000. The cost will be US$1,500 for the XPS course and US$1,000 for the CasaXPS course or US$2,250 for both XPS courses. I will also offer a 20% discount if two or more participants attend from the same organization. Please pass on this information to your colleagues, and let me know if you plan to attend any of these courses. I provide a 30-day license for CasaXPS should you not have the program, as well as the data we will process during the hands-on CasaXPS training. For the AES and XPS courses, you will receive a pdf copy of all the slides I will use in the course.

 

Click here for all SHORT COURSE DESCRIPTIONS

 

 

Instructor

The courses are being taught by John T. Grant, who has over 40 years experience in surface analysis, and who has been teaching such courses for many years. He had been a Distinguished Research Scientist at the University of Dayton for over 30 years. He is now a consultant in surface analysis. He is co-editor of the book: Surface Analysis by Auger and X-ray Photoelectron Spectroscopy.

 

 

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