Edited by
D. Briggs and J.T. Grant
900 pages
Published October 2003
Chapter 1. Perspectives on XPS and AES: Dave Briggs &
John Grant
Chapter 2. XPS: Basic Principles, Spectral Features and
Qualitative Analysis: Dave Briggs
Chapter 3. AES: Basic Principles, Spectral Features and Qualitative
Analysis: John Grant
Chapter 4. Specimen Preparation and Handling: Joe
Geller
Chapter 5. XPS: Instrumentation and Performance: Ian
Drummond
Chapter 6. AES: Instrumentation and Performance: Masato Kudo
Chapter 7. Instrument Calibration for AES and XPS: Martin
Seah
Chapter 8. Analyzing Insulators with XPS and AES: Mike Kelly
Chapter 9. Beam Effects During AES and XPS Analysis: Don
Baer, Mark Engelhard, Dan Gaspar, and Scott Lea
Chapter 10. Electron Transport in Solids: Wolfgang
Werner
Chapter 11. Electron Attenuation Lengths: Shigeo Tanuma
Chapter 12. Quantification of Nanostructures by Electron
Spectroscopy: Sven Tougaard
Chapter 13. Quantification in AES and XPS: Martin Seah
Chapter 14. The Use of Chemometrics in AES and XPS Data
Treatment: Bill Stickle
Chapter 15. XPS Lineshapes and Curve-fitting: Neal
Fairley
Chapter 16. Chemical effects in XPS: Laszlo Kover
Chapter 17. Chemical Information from Auger Lineshapes: Dave
Ramaker
Chapter 18. The Auger parameter: Giuliano Moretti
Chapter 19.
Chapter 20. Structural Effects in XPS and AES: Diffraction: Jürg Osterwalder
Chapter 21. Electron backscattering and channeling: Ding Ze-jun & Ryuichi
Chapter 22. XPS/AES sputter depth profiling: Thomas Wagner, Jy Wang, Siegfried Hofmann
Chapter 23. Angle resolved: Peter Cumpson
Chapter 24. XPS Imaging: Kateryna Artyushkova+
Julia Fulghum
Chapter 25. Processing, Interpretation and Quantification of
Auger Images: Martin Prutton
Chapter 26. X-ray Photoelectron Spectroscopy and Imaging at
Synchrotrons: Giorgio Margaritondo
Chapter 27. Total Reflection X-ray Photoelectron
Spectroscopy (TRXPS): Yoshitoki Iijima
Chapter 28. Ion-excited Auger Electron Spectroscopy: John
Grant
Chapter 29. Positron-annihilation-induced Auger Electron
Spectroscopy: Toshiyuki Ohdaira
Chapter 30. Electron Coincidence Measurements: Steve Thurgate
Chapter 31. Recent Developments in the Theory of Auger
Spectroscopy: Peter Weightman
Appendix A: Peak Positions from Mg X-rays and from Al X-rays
by Atomic Number
Appendix B: Peak Positions from Mg X-rays and from Al X-rays
in Numerical Order
Appendix C: Auger Kinetic Energies and Sensitivity Factors
by Atomic Number
Appendix D: Auger Kinetic Energies in Numerical Order
Appendix E. Polymer C 1s Chemical Shifts
Appendix F. Comparing Beam Damage Rates Using Susceptibility
Tables
Appendix G. Manufacturers of AES and XPS Systems
Appendix H. Software for Processing AES and XPS Data
Appendix J. Measurement and Documentary Standards
Appendix K. Internet Resources
Ordering information: Contact
John Grant
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